Invited Lectures J
Sheikh AKBAR / Derek MILLER, Ohio State University, USA
Mihai BREZEANU, Honeywell Romania S.R.L, Romania
Prabir DUTTA, Ohio State University, USA
Mauro EPIFANI, CNR-IMM, Italy
Xingmin GUO, University of Science and Technology Beijing, China
Radu IONESCU, Tesfalem WELEAREGAY, Universitat Rovira i Virgili, Spain
Ho Won JANG, Seoul National University, South Korea
Wolfgang KNOLL, Austrian Institute of Technology GmbH, Austria
Jong-Heun LEE, Korea University, South Korea
Xiaogan LI, Dalian University, China
Peter Alexander LIEBERZEIT, University of Vienna, Austria
Maiko NISHIBORI, Kyushu University, Japan
Stefan PALZER, University of Freiburg, Germany
Ralf RIEDEL, Technical University of Darmstadt, Germany
Tilman SAUERWALD, Saarland University, Germany
Kengo SHIMANOE, Kyushu University, Japan
Yasuhiro SHIMIZU, Nagasaki University, Japan
Alexander SINITSKII, University of Nebraska-Lincoln, USA
Wojtek WLODARSKI, RMIT University, Australia
Mihai BREZEANU, Honeywell Romania S.R.L, Romania
Prabir DUTTA, Ohio State University, USA
Mauro EPIFANI, CNR-IMM, Italy
Xingmin GUO, University of Science and Technology Beijing, China
Radu IONESCU, Tesfalem WELEAREGAY, Universitat Rovira i Virgili, Spain
Ho Won JANG, Seoul National University, South Korea
Wolfgang KNOLL, Austrian Institute of Technology GmbH, Austria
Jong-Heun LEE, Korea University, South Korea
Xiaogan LI, Dalian University, China
Peter Alexander LIEBERZEIT, University of Vienna, Austria
Maiko NISHIBORI, Kyushu University, Japan
Stefan PALZER, University of Freiburg, Germany
Ralf RIEDEL, Technical University of Darmstadt, Germany
Tilman SAUERWALD, Saarland University, Germany
Kengo SHIMANOE, Kyushu University, Japan
Yasuhiro SHIMIZU, Nagasaki University, Japan
Alexander SINITSKII, University of Nebraska-Lincoln, USA
Wojtek WLODARSKI, RMIT University, Australia